Surface reconstructions of 3C-SiC(001) studied by high-resolution core-level photoemission

Citation
Hw. Yeom et al., Surface reconstructions of 3C-SiC(001) studied by high-resolution core-level photoemission, SURF SCI, 435, 1999, pp. 392-396
Citations number
12
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
435
Year of publication
1999
Pages
392 - 396
Database
ISI
SICI code
0039-6028(19990802)435:<392:SRO3SB>2.0.ZU;2-C
Abstract
The different surface reconstructions of the 3C-SiC(001) surface have been systematically studied by high-resolution core-level photoelectron spectros copy. For the Si-rich 3 x 2 surface, three different Si 2p surface componen ts are clearly identified supporting the structure model with 2/3 ML of Si ad-dimers. It is confirmed that the c(2 x 2) and 2 x 1 surfaces are respect ively C- and Si-terminated by observing a single dominant surface component in the C 1s or Si 2p spectra with binding energy shifts of 1.04 eV and -0. 50 eV respectively relative to the bulk component. The atomic origins of th ese surface core levels are assigned and the core-level shifts are compared with previous measurements and recent theoretical calculations. (C) 1999 E lsevier Science B.V. All rights reserved.