Al/Si(111)-H Schottky interfaces are studied by X-ray photoelectron spectro
scopy and atomic force microscopy. It is shown that all hydrogen atoms that
terminated the original clean Si(111) surface still exist at the buried Al
/Si(111)-H interface. It is also shown that the existence of hydrogen at th
e Al/Si(111)-H Schottky interface suppresses agglomeration of the Al film a
t 923 K. (C) 1999 Elsevier Science B.V, All rights reserved.