Effect of Y doping on the Bi-O layers of Bi2Sr2CaCu2O8+delta single crystals: a scanning tunnelling microscopy study

Citation
Cej. Mitchell et al., Effect of Y doping on the Bi-O layers of Bi2Sr2CaCu2O8+delta single crystals: a scanning tunnelling microscopy study, SURF SCI, 435, 1999, pp. 728-733
Citations number
17
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
435
Year of publication
1999
Pages
728 - 733
Database
ISI
SICI code
0039-6028(19990802)435:<728:EOYDOT>2.0.ZU;2-U
Abstract
Scanning tunnelling microscopy measurements were performed in ultrahigh vac uum on the cleaved (001) surfaces of Bi2Sr2CaCu2O8+delta samples in which 0 , 30 and 46% of the Ca2+ was substituted by Y3+. The structural modulation of the Bi-O planes along [010] was observed on all of the samples, and the average period was measured over a number of images for each sample. The me asured periods were 27.1 +/- 3 Angstrom for 0% Y, 27.7 +/- 3 Angstrom for 3 0% Y, and 25.7 +/- 2 Angstrom for 46% Y. Atomic-resolution images of the 46 % Y-doped sample revealed significant distortions in both the modulation an d the underlying lattice. (C) 1999 Elsevier Science B.V. All rights reserve d.