Cej. Mitchell et al., Effect of Y doping on the Bi-O layers of Bi2Sr2CaCu2O8+delta single crystals: a scanning tunnelling microscopy study, SURF SCI, 435, 1999, pp. 728-733
Scanning tunnelling microscopy measurements were performed in ultrahigh vac
uum on the cleaved (001) surfaces of Bi2Sr2CaCu2O8+delta samples in which 0
, 30 and 46% of the Ca2+ was substituted by Y3+. The structural modulation
of the Bi-O planes along [010] was observed on all of the samples, and the
average period was measured over a number of images for each sample. The me
asured periods were 27.1 +/- 3 Angstrom for 0% Y, 27.7 +/- 3 Angstrom for 3
0% Y, and 25.7 +/- 2 Angstrom for 46% Y. Atomic-resolution images of the 46
% Y-doped sample revealed significant distortions in both the modulation an
d the underlying lattice. (C) 1999 Elsevier Science B.V. All rights reserve
d.