Study on microstructural characterization and ferromagnetic resonance in sputtered Co/V multilayers

Citation
J. Wu et al., Study on microstructural characterization and ferromagnetic resonance in sputtered Co/V multilayers, ACT PHY C E, 48(1), 1999, pp. 171-179
Citations number
26
Categorie Soggetti
Physics
Journal title
WULI XUEBAO
ISSN journal
10003290 → ACNP
Volume
48
Issue
1
Year of publication
1999
Pages
171 - 179
Database
ISI
SICI code
1000-3290(199901)48:1<171:SOMCAF>2.0.ZU;2-Z
Abstract
The structure and magnetic properties of a series of rf sputtered [Co(1.5 n m)/V(d(v))](20)(0.5 nm less than or equal to d(v) less than or equal to 4 n m)multilayers have been studied. The multilayers structure is found by X-ra y diffraction, cross-section transmission electron microscopy, and high-res olution transmission electron microscopy to be polycrystalline with small i ndividual columnar grains and has fairly strong fee Co(111) and bcc V(110) texture in the film growth direction. The structural characterizations also show composition-modulated structure and severely alloyed effect. Ferromag netic resonance measurements show relatively small g factors and 4 pi M-eff values, which also indicates that multilayers are severely alloyed. Compli cated spin wave resonance spectra were observed and analyzed. The evaluated small interlayer coupling constant shows the effect of weak exchange coupl ing between Co layers across V spacers.