Jf. Hicks et al., The monolayer thickness dependence of quantized double-layer capacitances of monolayer-protected gold clusters, ANALYT CHEM, 71(17), 1999, pp. 3703-3711
This report-describes how the electrochemical double-layer capacitances of
nanometer-sized alkanethiolate monolayer-protected An dusters (MPCs) dissol
ved in electrolyte solution depend on the alkanethiolate chain length (C4 t
o C16), The double-layer capacitances of individual MPCs (C-CLU) are suffic
iently small (sub-attoFarad, aF) that : their metal core potentials change
by > 0.1 V increments for single electron transfers at the electrode/soluti
on interface. Thus, the current peaks observed are termed "quantized double
layer charging peaks", and their spacing on the potential axis caries with
C-CLU. Differential pulse voltammetric measurements of C-CLU in solutions
of core-size-fractionated (i.e., monodisperse) MPCs are compared to a simpl
e theoretical model, which considers the capacitance as governed by the thi
ckness of a dielectric material (the monolayer, whose chain length is varie
d) between concentric spheres of conductors (the Au core and the electrolyt
e solution). The experimental results fit the simple model remarkably well.
The prominent differential pulse voltammetric charging peaks additionally
establish this method, along with high-resolution transmission electron mic
roscopy and laser ionization-desorption mass spectrometry, as a tool for ev
aluating the degree of monodispersity of MPC preparations. We additionally
report on a new tactic for the preparation of monodisperse MPCs with hexane
thiolate monolayers.