CRYSTAL DATA, ELECTRICAL-RESISTIVITY AND MOBILITY IN CU3IN5SE9 AND CU3IN5TE9 SINGLE-CRYSTALS

Citation
M. Parlak et al., CRYSTAL DATA, ELECTRICAL-RESISTIVITY AND MOBILITY IN CU3IN5SE9 AND CU3IN5TE9 SINGLE-CRYSTALS, Crystal research and technology, 32(3), 1997, pp. 395-400
Citations number
10
Categorie Soggetti
Crystallography
ISSN journal
02321300
Volume
32
Issue
3
Year of publication
1997
Pages
395 - 400
Database
ISI
SICI code
0232-1300(1997)32:3<395:CDEAMI>2.0.ZU;2-P
Abstract
X-ray powder diffraction data were obtained for Cu3In5Se9 and Cu3In5Te 9 which were found to crystallize in orthorhombic and tetragonal syste ms, respectively. The electrical resistivities and Hall mobilities of these compounds were investigated in the temperature range 35-475 K. C u3In5Se9 was identified to be n-type with a room temperature resistivi ty of 3 x 10(3) Omega.cm which decreases with increasing temperature. For T < 65 K impurity activation energy of 0.03 eV and for T > 350 K o nset of intrinsic conduction yielding a band gap energy of 0.99 eV wer e detected. The neutral impurity scattering was found to dominate at l ow temperatures, while in the high temperature region thermally activa ted mobility was observed. Cu3In5Te9 exhibits p-type conduction with a room temperature resistivity of 8.5 x 10(-3) Omega.cm decreasing shar ply above 400 K and yielding an impurity ionization energy of 0.13 eV. The temperature dependence of mobility indicates the presence of latt ice and ionized impurity scattering mechanisms above and below 160 K, respectively.