CHARACTERIZATION OF A FLUX-GROWN NDXY1-XAL3(BO3)(4) CRYSTAL BY X-RAY PROJECTION TOPOGRAPHY

Authors
HU XB JIANG SS WANG JY HUANG XR LIU WJ ZENG W PAN HF
Citation
Xb. Hu et al., CHARACTERIZATION OF A FLUX-GROWN NDXY1-XAL3(BO3)(4) CRYSTAL BY X-RAY PROJECTION TOPOGRAPHY, Crystal research and technology, 32(3), 1997, pp. 407-411
Citations number
13
Categorie Soggetti
Crystallography
Journal title
Crystal research and technology → ACNP
ISSN journal
02321300
Volume
32
Issue
3
Year of publication
1997
Pages
407 - 411
Database
ISI
SICI code
0232-1300(1997)32:3<407:COAFNC>2.0.ZU;2-M
Abstract
NdxY1-xAl3(BO3)(4) (NYAB) single crystal was grown by the flux method using K2CO3-MoO3 as a solvent. By x-ray projection topography, the def ects on a (0001) slice of the NYAB crystal are investigated. It is fou nd that the main grown-in defects in NYAB crystal are growth bands, gr owth sector boundaries and inclusions. The formation of defects is dis cussed and methods to reduce the defects are proposed.