PVT AND CVT GROWTH AND CHARACTERIZATION OF SNSXSE2-X 0-LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-2) SINGLE-CRYSTALS

Citation
Dh. Patel et al., PVT AND CVT GROWTH AND CHARACTERIZATION OF SNSXSE2-X 0-LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-2) SINGLE-CRYSTALS, Crystal research and technology, 32(3), 1997, pp. 443-448
Citations number
9
Categorie Soggetti
Crystallography
ISSN journal
02321300
Volume
32
Issue
3
Year of publication
1997
Pages
443 - 448
Database
ISI
SICI code
0232-1300(1997)32:3<443:PACGAC>2.0.ZU;2-E
Abstract
Single crystals of solid solutions of tin sulphoselenide have been gro wn in the same ampoule. Specific conditions for growing single crystal s of SnSSe have also been identified. A study of microstructures on th e growth surfaces responds to the mechanism of growth of these crystal s. The dependence of electrical resistivity, Hall mobility and carrier concentration with the values of the configuration parameter x has be en studied.