Electrical characterization of integrated circuit molding compound

Citation
Cc. Green et al., Electrical characterization of integrated circuit molding compound, IEEE T AD P, 22(3), 1999, pp. 337-342
Citations number
8
Categorie Soggetti
Material Science & Engineering
Journal title
IEEE TRANSACTIONS ON ADVANCED PACKAGING
ISSN journal
15213323 → ACNP
Volume
22
Issue
3
Year of publication
1999
Pages
337 - 342
Database
ISI
SICI code
1521-3323(199908)22:3<337:ECOICM>2.0.ZU;2-W
Abstract
Broadband dielectric characterization techniques were applied to a novolac epoxy molding compound used in the integrated circuit industry. Both dielec tric loss tangent and relative dielectric constant were determined over the frequency range from 100 MHz to 1.4 GHz, using two independent measurement methods. The molding compound was in "as-molded condition," which resemble s the use conditions for the material.