Photoemission and conductivity measurement of poly(N-methyl aniline) and poly(N-ethyl aniline) films

Citation
Aa. Athawale et al., Photoemission and conductivity measurement of poly(N-methyl aniline) and poly(N-ethyl aniline) films, J APPL POLY, 74(5), 1999, pp. 1286-1292
Citations number
11
Categorie Soggetti
Organic Chemistry/Polymer Science","Material Science & Engineering
Journal title
JOURNAL OF APPLIED POLYMER SCIENCE
ISSN journal
00218995 → ACNP
Volume
74
Issue
5
Year of publication
1999
Pages
1286 - 1292
Database
ISI
SICI code
0021-8995(19991031)74:5<1286:PACMOP>2.0.ZU;2-5
Abstract
The studies involve the X-ray photoelectron spectroscopy (XPS) and conducti vity measurements of poly(N-methyl aniline) and poly(N-ethyl aniline) films deposited electrochemically at different pH values of -0.96, 2.22, and 3.7 8 for N-methyl aniline and 1.10, 2.22, and 3.78 for N-ethyl aniline. The re sults obtained reveal significant differences in the film properties of the two matrices as a function of pH of solution. These differences are explai ned on the basis of the competitive reaction products formed during polymer ization in the two matrices along with the differences in the electron-dona ting ability of the methyl and ethyl groups present on the nitrogen (N) ato m. These results are further supported by the UV-Visible and IR data. (C) 1 999 John Wiley & Sons, Inc.