Combined X-ray and neutron diffraction from binary liquids and amorphous semiconductors

Neutron scattering and isotopic substitution has been established as a meth od of unambiguously determining the partial structure factors of binary liq uid and amorphous materials. In this paper we present results of an extensi on of this method to include X-ray diffraction as a method of enhancing the structural information obtained. We have applied a combination of two neut ron diffraction experiments using isotopic substitution and one X-ray diffr action experiment to obtain the partial structure factors and pair distribu tion functions of liquid TlSe. We have applied the anomalous X-ray diffract ion technique to glassy PSe using the Se K-edge. The results show that the first sharp diffraction peak observed in this glass arises almost entirely from the P-P correlations. We have applied the combined X-ray anomalous sca ttering and neutron diffraction technique to obtain the partial structure f actors of glassy GeO2. The results from two independent data sets have been compared and are in good agreement. (C) 1999 Elsevier Science B.V. All rig hts reserved.