The high- and low-temperature forms, i.e., phase I (stable above 328 K) and
phase II (stable below 328 K), of Cu8GeSe6 have been investigated by the p
owder X-ray diffraction method. Cu8GeSe6 II is hexagonal with A = 12.6438(2
), C = 11.7570(1) Angstrom, Z = 6, and P6(3)cm, and its structure is consid
ered to be a superstructure of the high-temperature form, Cu8GeSe6I (hexago
nal, a = 7.3164(4) congruent to A/root 3, c = 11.7679(7) Angstrom, Z = 2, a
nd P6(3)mc). Rietveld analysis of Cu8GeSe6 I (350 K) and II (290 K) has bee
n performed using diffraction data measured by a high-resolution ponder dif
fractometer and synchrotron X-ray radiation. For Cu8GeSe6 II, a four-dimens
ional superspace group for commensurate modulation, P6(3)mc(1/3 1/3 0), wit
h basic cell constants a = 7.2999, c = 11.7570 Angstrom has been successful
ly applied (R-wp = 0.054). The superspace-group description allows uniform
treatment of both forms, and the phase transition of Cu8GeSe6 is explained
in terms of the presence and absence of commensurate modulation waves. (C)
1999 Academic Press.