X-ray imaging with photon counting hybrid semiconductor pixel detectors

Citation
S. Manolopoulos et al., X-ray imaging with photon counting hybrid semiconductor pixel detectors, NUCL INST A, 434(1), 1999, pp. 38-43
Citations number
16
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
434
Issue
1
Year of publication
1999
Pages
38 - 43
Database
ISI
SICI code
0168-9002(19990911)434:1<38:XIWPCH>2.0.ZU;2-7
Abstract
Semiconductor pixel detectors, originally developed for particle physics ex periments, have been studied as X-ray imaging devices. The performance of d evices using the Ohm 3 read-out chip bump-bonded to pixellated silicon semi conductor detectors is characterised in terms of their signal-to-noise rati o when exposed to 60 kVp X-rays. Although parts of the devices achieve valu es of this ratio compatible with the noise being photon statistics limited, this is not found to hold for the whole pixel matrix, resulting in the glo bal signal-to-noise ratio being compromised. First results are presented of X-ray images taken with a gallium arsenide pixel detector bump-bended to a new read-out chip, (MEDIPIX), which is a single photon counting read-out c hip incorporating a 15-bit counter in every pixel. (C) 1999 Elsevier Scienc e B.V. All rights reserved.