CdTe(Cl) detectors from CdTe single crystals, grown by the Bridgman method
from Te-rich melt, were fabricated. The quality of the detectors was tested
with Co-57 and Am-241 sources. In the Co-57 spectrum low noise is demonstr
ated by the presence of a 14 keV peak and good resolution approximate to 7
keV (FWHM) evident from the separation of 122 and 136 keV peaks. A review i
s given of the state-of-the-art properties of (CdZn)Te single crystals prep
ared for substrates in the Institute of Physics of Charles University. The
quality of samples is tested by measurements of the diffusion length of min
ority carriers, from which the mobility-lifetime product is evaluated. (C)
1999 Elsevier Science B.V. All rights reserved.