Multiple Andreev reflections in ballistic Nb-InGaAs/InP-Nb junctions

Citation
T. Schapers et al., Multiple Andreev reflections in ballistic Nb-InGaAs/InP-Nb junctions, SUPERLATT M, 25(5-6), 1999, pp. 851-859
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SUPERLATTICES AND MICROSTRUCTURES
ISSN journal
07496036 → ACNP
Volume
25
Issue
5-6
Year of publication
1999
Pages
851 - 859
Database
ISI
SICI code
0749-6036(199905/06)25:5-6<851:MARIBN>2.0.ZU;2-J
Abstract
The current-voltage characteristics of ballistic Nb-InGaAs/InP-Nb Josephson junctions have been investigated. At temperatures below 1 K a negative dif ferential conductance, which usually leads to a hysteresis in the current-v oltage characteristics, was resolved by connecting an additional external s hunt resistor to the junction. The negative differential conductance is exp lained by heating and conductance enhancement due to multiple Andreev refle ctions. The structures observed in the differential resistance measurements as a function of the bias voltage are explained by self-detection of Josep hson radiation at low bias voltages and subharmonic gap structures at highe r bias voltages. (C) 1999 Academic Press.