Scanning squid microscopy

Citation
Jr. Kirtley et Jp. Wikswo, Scanning squid microscopy, ANN R MATER, 29, 1999, pp. 117-148
Citations number
98
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
ANNUAL REVIEW OF MATERIALS SCIENCE
ISSN journal
00846600 → ACNP
Volume
29
Year of publication
1999
Pages
117 - 148
Database
ISI
SICI code
0084-6600(1999)29:<117:SSM>2.0.ZU;2-V
Abstract
The scanning SQUID microscope (SSM) is a powerful tool for imaging magnetic fields above sample surfaces. It has the advantage of high sensitivity;md bandwidth and the disadvantages of relatively modest spatial resolution and the requirement of a cooled SQUID sensor. We describe the various implemen tations of this type of instrument and discuss a number of applications, in cluding magnetic imaging of short circuits in integrated circuits, corrosio n currents in aluminum, and trapped flux in superconductors.