Secondary ion mass spectrometry and optical characterization of Ti : LiNbO3 optical waveguides

Authors
Caccavale, F Sada, C Segato, F Cavuoti, F
Citation
F. Caccavale et al., Secondary ion mass spectrometry and optical characterization of Ti : LiNbO3 optical waveguides, APPL SURF S, 150(1-4), 1999, pp. 195-201
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
150
Issue
1-4
Year of publication
1999
Pages
195 - 201
Database
ISI
SICI code
0169-4332(199908)150:1-4<195:SIMSAO>2.0.ZU;2-A
Abstract
Secondary ion mass spectrometry (SIMS) and m-lines spectroscopy have been a pplied to study Ti:LiNbO3 slab optical waveguides with high titanium surfac e concentration. By combining the two techniques, a saturation in the depen dence of the refractive index change on the dopant concentration has been f ound. By the use of SIMS in image mode, the lateral diffusion of titanium i n Ti:LiNbO3 channel waveguides has been observed and analyzed. (C) 1999 Els evier Science B.V. All rights reserved.