Positron beam characterisation of a CVD-grown diamond thick film

Citation
M. Harting et al., Positron beam characterisation of a CVD-grown diamond thick film, APPL SURF S, 149(1-4), 1999, pp. 170-174
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
149
Issue
1-4
Year of publication
1999
Pages
170 - 174
Database
ISI
SICI code
0169-4332(199908)149:1-4<170:PBCOAC>2.0.ZU;2-N
Abstract
A composite structure consisting of a thick chemical vapour deposition (CVD ) polycrystalline diamond layer grown on an aluminium substrate, covered wi th a thin gold cap layer has been studied using positron beam and other tec hniques. The diamond layer has a strong [110] texture and also contains sma ll fractions of aluminium carbide and graphitic phases. Positron beam analy sis reveals two states, corresponding to a highly defective thin gold layer and an homogeneous diamond layer with large, essentially defect free, crys tallites. (C) 1999 Elsevier Science B.V. All rights reserved.