A slow positron beam study of natural and synthetic diamonds

Authors
Fischer, CG Connell, SH Coleman, PG Malik, F Britton, DT Sellschop, JPF
Citation
Cg. Fischer et al., A slow positron beam study of natural and synthetic diamonds, APPL SURF S, 149(1-4), 1999, pp. 221-226
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
149
Issue
1-4
Year of publication
1999
Pages
221 - 226
Database
ISI
SICI code
0169-4332(199908)149:1-4<221:ASPBSO>2.0.ZU;2-9
Abstract
We have depth profiled single crystalline natural type IIA, type IIB and sy nthetic type IB diamonds with a slow positron beam using Doppler broadening spectroscopy. It was found that the data for all three samples, which diff er with respect to defect type and content, could be well described using o nly a surface and a homogenous bulk component. The bulk positron diffusion lengths measured for these samples were found to be sensitive to the differ ing defect composition of the samples. (C) 1999 Elsevier Science B.V. All r ights reserved.