S. Eichler et R. Krause-rehberg, Comparison of experimental and theoretical Doppler broadening line-shape parameters, APPL SURF S, 149(1-4), 1999, pp. 227-233
The comparison of theoretically calculated and measured Doppler broadening
spectra opens up the possibility to directly identify vacancylike defects.
In the past, the interpretation of different experimentally obtained defect
-specific annihilation parameter has led to some confusion. In the present
study, the influence of the experimental energy resolution, of the choice o
f the interval limits for the determination of the Line-shape parameters, a
nd of the background on the Line-shape parameters S and W is investigated.
The analysis is carried out at theoretical spectra of differently sized vac
ancy clusters in silicon, calculated by Hakala et al. [M. Hakala, M.J. Pusk
a, R. Nieminen, Phys. Rev. B, 57 (1998) 7621]. The results are compared wit
h experimental data measured for silicon self-implanted samples. The consid
eration of the exact experimental conditions is very important for the comp
arison of experimental spectra between each other and with theoretical calc
ulations. (C) 1999 Elsevier Science B.V. All rights reserved.