Comparison of experimental and theoretical Doppler broadening line-shape parameters

Citation
S. Eichler et R. Krause-rehberg, Comparison of experimental and theoretical Doppler broadening line-shape parameters, APPL SURF S, 149(1-4), 1999, pp. 227-233
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
149
Issue
1-4
Year of publication
1999
Pages
227 - 233
Database
ISI
SICI code
0169-4332(199908)149:1-4<227:COEATD>2.0.ZU;2-M
Abstract
The comparison of theoretically calculated and measured Doppler broadening spectra opens up the possibility to directly identify vacancylike defects. In the past, the interpretation of different experimentally obtained defect -specific annihilation parameter has led to some confusion. In the present study, the influence of the experimental energy resolution, of the choice o f the interval limits for the determination of the Line-shape parameters, a nd of the background on the Line-shape parameters S and W is investigated. The analysis is carried out at theoretical spectra of differently sized vac ancy clusters in silicon, calculated by Hakala et al. [M. Hakala, M.J. Pusk a, R. Nieminen, Phys. Rev. B, 57 (1998) 7621]. The results are compared wit h experimental data measured for silicon self-implanted samples. The consid eration of the exact experimental conditions is very important for the comp arison of experimental spectra between each other and with theoretical calc ulations. (C) 1999 Elsevier Science B.V. All rights reserved.