Mechanical fatigue of thin copper foil

Citation
Hd. Merchant et al., Mechanical fatigue of thin copper foil, J ELEC MAT, 28(9), 1999, pp. 998-1007
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
28
Issue
9
Year of publication
1999
Pages
998 - 1007
Database
ISI
SICI code
0361-5235(199909)28:9<998:MFOTCF>2.0.ZU;2-U
Abstract
The electrodeposited and the rolled 12 to 35 mu m thick copper foils are su bjected to the bending/unbending strain-controlled flex fatigue over a wide range of strain amplitudes. The fatigue life is associated with an increas e in electrical resistance of the specimen beyond a preassigned threshold. For each foil type, in the rolled or as-deposited as well as in the (recrys tallization-like) annealed conditions, the inverse Coffin-Manson (C-M) rela tionship between strain amplitude (Delta epsilon/2) and fatigue life (N-f) is established in the high Delta epsilon/2 (low N-f) and the low Delta epsi lon/2 (high N-f) regimes. The N-f, Delta epsilon/2, and C-M slopes (c,b) ar e utilized to calculate the cyclic strain hardening (n') and fatigue ductil ity (D-f) parameters. It is shown that for a given foil thickness, an unive rsal relationship exists between D-f and the strength (sigma) normalized fa tigue life (N-f/sigma). The propagation of fatigue crack through the foil t hickness and across the sample width is related to the unique fine grain st ructure for each foil type: pancaked grains for the rolled foil and equiaxe d grains for the electrodeposited foil. The fatal failure corresponds to co nvergence of the through-thickness and the across-the-width fatigue cracks. The variations in (i) electrical resistance, (ii) mid-thickness microhardn ess and grain structure and (iii) dislocation configurations with fatigue a re monitored. Except for a small but significant fatigue induced softening (or hardening), no convincing evidence of strain localization land the asso ciated dislocation configurations generally observed for the bulk samples) has been found.