Ion trajectories in atom probe field ion microscopy and gas field ion sources

Authors
de Castilho, CMC
Citation
Cmc. De Castilho, Ion trajectories in atom probe field ion microscopy and gas field ion sources, J PHYS D, 32(17), 1999, pp. 2261-2265
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS D-APPLIED PHYSICS
ISSN journal
00223727 → ACNP
Volume
32
Issue
17
Year of publication
1999
Pages
2261 - 2265
Database
ISI
SICI code
0022-3727(19990907)32:17<2261:ITIAPF>2.0.ZU;2-1
Abstract
Trajectories of positive ions produced in a region close to a structured su rface, modelled by spherical or spheroidal protrusions and kept at a positi ve electric potential with respect to a distant screen or detector are calc ulated. The results are discussed in comparison with similar practical situ ations produced by field ionization and field evaporation or desorption, su ch as those occurring in gas field ion sources, field ion microscopy and fi eld desorption spectroscopy.