A simple economical conventional vacuum system was used for evaporation of
YBCO thin films on as-deposited unbuffered Ag layers on MgO substrates. The
subsequent heat treatment was carried out in low oxygen partial pressure a
t a relative low temperature and short dwelling time. The films thus obtain
ed were characterized for electrical properties using de four-probe electri
cal measurements and inspected for structural properties and chemical compo
sition by scanning electron microscopy (SEM).