Molecular organic thin films of p-nitrophenyl nitronyl nitroxide: Surface morphology and polymorphism

Authors
Fraxedas, J Caro, J Santiso, J Figueras, A Gorostiza, P Sanz, F
Citation
J. Fraxedas et al., Molecular organic thin films of p-nitrophenyl nitronyl nitroxide: Surface morphology and polymorphism, PHYS ST S-B, 215(1), 1999, pp. 859-863
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI B-BASIC RESEARCH
ISSN journal
03701972 → ACNP
Volume
215
Issue
1
Year of publication
1999
Pages
859 - 863
Database
ISI
SICI code
0370-1972(199909)215:1<859:MOTFOP>2.0.ZU;2-5
Abstract
Highly oriented thin films (thickness approximate to 1 to 2 mu m) of the mo lecular organic radical p-nitrophenyl nitronyl nitroxide (p-NPNN) have been grown by thermal evaporation in high vacuum on three different substrates: NaCl (001), mica, and highly oriented pyrolytic graphite (HOPG). The surfa ces associated to three polymorphs (alpha, beta and delta) reveal clearly d ifferentiated nanometer-scale morphologies as evidenced by Tapping Mode Ato mic Force Microscopy (TMAFM) measurements.