Anomalous behavior of the near-threshold photoionization cross section of the neon isoelectronic sequence: A combined experimental and theoretical study

Citation
Hs. Chakraborty et al., Anomalous behavior of the near-threshold photoionization cross section of the neon isoelectronic sequence: A combined experimental and theoretical study, PHYS REV L, 83(11), 1999, pp. 2151-2154
Citations number
20
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
83
Issue
11
Year of publication
1999
Pages
2151 - 2154
Database
ISI
SICI code
0031-9007(19990913)83:11<2151:ABOTNP>2.0.ZU;2-N
Abstract
We present a combined theoretical and experimental investigation of photoio nization along the Ne isoelectronic sequence and show that the near-thresho ld behavior of the cross section for Si4+ differs radically from the nearby ions in the sequence. We demonstrate that the general nature of the underl ying physics implies that dramatic changes in near-threshold behavior may b e expected for many other ions.