A comparison of the properties of chemical vapor transport deposited CdS thin films using different precursors

Citation
Me. Calixto et Pj. Sebastian, A comparison of the properties of chemical vapor transport deposited CdS thin films using different precursors, SOL EN MAT, 59(1-2), 1999, pp. 65-74
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
SOLAR ENERGY MATERIALS AND SOLAR CELLS
ISSN journal
09270248 → ACNP
Volume
59
Issue
1-2
Year of publication
1999
Pages
65 - 74
Database
ISI
SICI code
0927-0248(199909)59:1-2<65:ACOTPO>2.0.ZU;2-3
Abstract
CdS thin films were deposited from chemically precipitated and high purity CdS precursors adopting chemical vapor transport by gas (CVTG) method. In t he present study, chemically precipitated and high purity CdS with CdCl2 fl ux was used as precursors for the chemical vapor transport. The structural, electrical, optical and opto-electronic properties varied depending on the type of the precursors used for chemical vapor transport and the condensat ion temperature. In both the cases two distinct kinds of films (intrinsic-C dS and semiconducting CdS) were formed depending on the film condensation t emperature. The intrinsic films showed a band gap close to 2.45 eV, where a s the n-type films exhibited band gaps below 2 eV. (C) 1999 Elsevier scienc e B.V. All rights reserved.