AFM as a surface probe - Beyond structural information

We provide a general introduction to the recent progress made in microscopi c studies using scanning force microscopy (SFM). The effects associated wit h adhesion, friction and lateral forces are analysed and utilized as a mean s of characterizing surface properties. It is demonstrated that contact mod e atomic force microscopy (AFM) could be used to study quantitatively the f riction of domains of molecular thin films, whereas tapping mode AFM is use d to reveal the elastic behaviour of monodispersed polymer globules. Copyri ght (C) 1999 John Wiley & Sons, Ltd.