Correlation between frequency-sweep hysteresis and phase imaging instability in tapping mode atomic force microscopy

Authors
Bar, G Brandsch, R Whangbo, MH
Citation
G. Bar et al., Correlation between frequency-sweep hysteresis and phase imaging instability in tapping mode atomic force microscopy, SURF SCI, 436(1-3), 1999, pp. L715-L723
Citations number
22
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
436
Issue
1-3
Year of publication
1999
Pages
L715 - L723
Database
ISI
SICI code
0039-6028(19990810)436:1-3<L715:CBFHAP>2.0.ZU;2-#
Abstract
Frequency-sweep and phase imaging experiments of tapping mode atomic force microscopy were carried out for patterned self-assembled monolayers of S(CH 2)(15)CH3 and S (CH2)(12)OH groups on a polycrystalline Au substrate. The p hase shift values of opposite signs associated with phase imaging instabili ty are shown to be the same as the corresponding ones resulting from freque ncy-sweep hysteresis. (C) 1999 Elsevier Science B.V. All rights reserved.