The stereological estimation of the spatial grain size distribution from da
ta obtained from planar sections of the microstructure has been subject of
investigation already for a long time. The reason why stereological estimat
ion is still an alive subject is due to the fact that numerical as well as
statistical methods are involved and no clear criterion exists for the qual
ity of the algorithms. The use of a crystallographically adequate shape ass
umption for the grains reduces the bias of the estimation. The solution of
the stereological equation based on this shape assumption requires a comput
ation of the probabilities of the different cases of prism sections by mean
s of computer simulation. The stereological method has been applied to two
examples: (li the comparison of hot isostatic pressed and gas pressure sint
ered silicon nitride microstructures and (2) the microstructural evolution
during long term sintering. In both cases significant variations of the gra
in population was quantified. Also considered in the method with adequate r
eliability is the detection of "rare" large grains. In (1) some effect of g
rain size and aspect ratio could be verified on the crack resistance. In (2
) the growth of silicon nitride grain populations have been studied during
sintering.