A straightforward approach to spin-polarized scanning tunneling microscopy
based on the magnetotunnel effect between a ferromagnetic tip and a ferroma
gnetic sample is demonstrated. By periodically changing the magnetization o
f the tip in combination with a lock-in technique, topographic and spin-dep
endent parts of the tunnel current are separated and the topography and the
magnetic structure of the sample are recorded simultaneously. Results are
given for polycrystalline Ni and single crystalline Co(0001) surfaces, reve
aling a high spin contrast, low data acquisition times, and a resolution do
wn to 10 nm. Potentials and limitations of this technique are discussed. (C
) 1999 American Institute of Physics. [S0003-6951(99)00439-8].