By placing a direct-gap monitor layer (or collector) in the p-cladding laye
r of red-emitting AlGaInP laser diode structures, we have studied the trans
port of electrons through this layer by observation of spontaneous emission
. Pulsed optical excitation superimposed on cw electrical injection has bee
n used to determine the delay time between optical injection of carriers in
to the well and radiative recombination from the monitor pit. Computer simu
lations using measured values of minority carrier lifetime for the well and
monitor layer show that the transit time for electrons through the p-cladd
ing layer correspond to an electron mobility of 160 cm(2)/V s. (C) 1999 Ame
rican Institute of Physics. [S0003-6951(99)02238-X].