Factor analysis and XPS-data preprocessing for non-conducting samples

Citation
S. Oswald et S. Baunack, Factor analysis and XPS-data preprocessing for non-conducting samples, FRESEN J AN, 365(1-3), 1999, pp. 59-62
Citations number
8
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY
ISSN journal
09370633 → ACNP
Volume
365
Issue
1-3
Year of publication
1999
Pages
59 - 62
Database
ISI
SICI code
0937-0633(199909/10)365:1-3<59:FAAXPF>2.0.ZU;2-W
Abstract
The use of factor analysis for automatic interpretation of electron spectra needs in some cases a special data preprocessing. It was shown for x-ray p hotoelectron spectroscopy that in the case of non-conducting samples in add ition to experimental methods (low energy electron flooding) a shift of the measured spectra with respect to a reference peak was useful. Thus, the re sidual energy shift due to sample charging, especially if the surface condu ctivity changes during measurement, could be removed. Several shift methods and the influence of different reference peaks were discussed.