We investigate loss mechanisms in 1.55-mu m In-GaAsP-InP multiquantum-well
ridge-waveguide laser diodes at room temperature. The common method of meas
uring light versus current curves and plotting the inverse slope efficiency
versus laser length is employed to extract the internal optical loss alpha
(i) and the differential internal efficiency eta(i). This method neglects t
he dependence of both the parameters on the laser cavity length L. We analy
ze physical mechanisms behind these loss parameters and their length depend
ence using the commercial laser simulation software PICS3D. Internal optica
l losses are dominated by carrier density dependent absorption, The differe
ntial internal efficiency above threshold is found to be mainly restricted
by carrier recombination losses within the quantum wells, i.e., Fermi level
pinning is not observed, Both loss mechanisms are enhanced with shorter ca
vity length due to the higher quantum well carrier density. For the shortes
t device measured (L = 269 mu m), we extract alpha(i) = 20 cm(-1) and eta(i
) = 66%. With increasing cavity length, the loss parameters approach alpha(
i) = 15 cm(-1) and eta(i) = 70%. From the inverse slope efficiency versus c
avity length plot, we obtain alpha(i) = 14 cm(-1) and eta(i) = 67% independ
ent of laser length.