650-nm lasers with narrow far-field divergence with integrated optical mode expansion layers

Citation
Pm. Smowton et al., 650-nm lasers with narrow far-field divergence with integrated optical mode expansion layers, IEEE S T QU, 5(3), 1999, pp. 735-739
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
ISSN journal
1077260X → ACNP
Volume
5
Issue
3
Year of publication
1999
Pages
735 - 739
Database
ISI
SICI code
1077-260X(199905/06)5:3<735:6LWNFD>2.0.ZU;2-Q
Abstract
By means of numerical simulation of the optical and electrical performance, we have designed 650-nm GaInP-AlGaInP quantum-well lasers with mode expans ion layers which have a narrow vertical far-field divergence without sacrif icing threshold current or threshold current temperature dependence. We hav e reduced the measured vertical far-field divergence in a 650-nm laser stru cture from 35 degrees to 24 degrees full-width at half-maximum without chan ging the threshold current, operating voltage, or threshold current tempera ture dependence. We have also calculated the tolerances in the thickness an d composition necessary to realize this design in practice.