Mjm. Van Der Vorst et al., Effect of internal reflections on the radiation properties and input admittance of integrated lens antennas, IEEE MICR T, 47(9), 1999, pp. 1696-1704
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
This paper begins with the modeling of the reflected waves within integrate
d lens antennas, which consist of a dielectric lens on which a planar anten
na is mounted. It is demonstrated that if the relative dielectric constant
of the lens is small (epsilon(r) less than or equal to 4), the single- and
double-reflected waves are sufficient to analyze the effect of the internal
reflections. For small angles around boresight, these unwanted reflected f
ields mainly affect the cross-polar far-held pattern, while for large obser
vation angles, both the co-polar and cross-polar patterns are significantly
disturbed. It appears that by neglecting the internally reflected field co
ntributions, the beam efficiency may be overestimated more than 10%, In thi
s paper, two types of matching layers are analyzed in order to reduce these
unwanted reflections. It is demonstrated that the radiation performances o
f the integrated lens antennas with optimum-thickness and quarter-wavelengt
h matching layer are almost equal. Even for low dielectric-constant lenses,
the beam efficiency can be increased by over 10%, Finally, it is demonstra
ted that the internal reflections may also have a strong effect on the ante
nna admittance, which can only be reduced partly by the use of a matching l
ayer.