G. Korevaar et al., In situ mass spetrometry during laser-induced chemical vapor deposition ofsilicon carbonitride, J PHYS IV, 9(P8), 1999, pp. 763-768
Mass spectrometry provides a means to study the kinetics of the decompositi
on of hexamethyldisilazane (HMDS) in detail. Towards this end, in situ mass
spectrometry during Laser-Induced Chemical Vapor Deposition (LCVD) of sili
con carbonitride is investigated. The reactant gases, HMDS, and ammonia, ar
e heated by a continuous wave CO2-laser in a parallel configuration with th
e substrate. In this way, silicon carbonitride deposits are formed at low s
ubstrate temperatures (300 degrees C). Insight in the formation of reaction
intermediairs during LCVD is obtained. The HMDS molecule splits at the Si-
N bonding due to laser radiat::on.