Xb. Tian et al., Accurate determination of pulsed current waveform in plasma immersion ion implantation processes, J APPL PHYS, 86(7), 1999, pp. 3567-3570
This article reports on the measurement of the ion current in plasma immers
ion ion implantation. Our simulation results indicate that the total curren
t peaks at the end of rise time of the applied voltage. However, our experi
mental data acquired using a Rogowski coil and digital oscillator show the
highest current at the beginning of the voltage pulse. The discrepancy can
be explained by a displacement current attributable to the changing voltage
, sheath capacitance, circuit loading effects, as well as secondary electro
n emission. (C) 1999 American Institute of Physics. [S0021- 8979(99)02919-9
].