Magnetoresistance and Hall effect in La0.8Sr0.2MnO3

Citation
Ae. Kar'Kin et al., Magnetoresistance and Hall effect in La0.8Sr0.2MnO3, J EXP TH PH, 89(2), 1999, pp. 358-365
Citations number
29
Categorie Soggetti
Physics
Journal title
JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS
ISSN journal
10637761 → ACNP
Volume
89
Issue
2
Year of publication
1999
Pages
358 - 365
Database
ISI
SICI code
1063-7761(199908)89:2<358:MAHEIL>2.0.ZU;2-V
Abstract
A comparative study of the longitudinal rho(xx) and transverse rho(xy) resi stivities and magnetic susceptibility chi(ac) of La0.8Sr0.2MnO3 single crys tals and ceramic samples has been conducted in a wide range of temperatures T=1.7-370 K and magnetic fields, H=0-13.6 T. It turned out that the relati on rho(xy)similar to rho(xx), which is expected to hold in the case of carr ier scattering by magnetic fluctuations, applies to the single crystals. In polycrystals, an additional H-dependent contribution to the resistivity te ntatively attributed to plane (near grain boundaries) and bulk "defects" of the magnetic sublattice has been detected. The scattering of carriers by t hese defects does not make a notable contribution to the anomalous Hall eff ect and magnetic susceptibility chi(ac). As a result, the curve of rho(xy) versus rho(xx) seems to be steeper than a linear dependence. Under the assu mption that the materials under investigation are metals with constant carr ier concentrations, the conductivity sigma=1/rho(xx) due to the critical ma gnetic scattering calculated in the molecular field approximation reproduce s the main features of experimental data, namely, the drop in the amplitude and shift of the resistivity peak near the Curie point with increasing mag netic field H and also a relatively slow change in the derivative d sigma/d H with increasing temperature in the region T less than or equal to T-C. Th e large hole concentration of about two per unit cell derived from Hall mea surements indicates that carriers of opposite signs can coexist in these ma terials. (C) 1999 American Institute of Physics. [S1063-7761(99)02308-2].