Beam reflection from multilayers with periodic and fractal distributions

Citation
M. Lehman et M. Garavaglia, Beam reflection from multilayers with periodic and fractal distributions, J MOD OPT, 46(11), 1999, pp. 1579-1593
Citations number
50
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF MODERN OPTICS
ISSN journal
09500340 → ACNP
Volume
46
Issue
11
Year of publication
1999
Pages
1579 - 1593
Database
ISI
SICI code
0950-0340(19990915)46:11<1579:BRFMWP>2.0.ZU;2-D
Abstract
An impedance model is used to solve the reflection problem from a multilaye r with periodic and Canter bar fractal distributions. It is based on the ca lculation of the input surface impedance of such a structure. The method co nsists of replacing the multilayer reflection problem by a simple reflectio n problem on a single surface. This approach has the additional advantage t hat only the fields above the surface should be taken into account. Numeric al calculation leads to an iterative method which can be implemented for ea ch polarization mode. The results for the input impedance function of the s ystem and for the reflectance are presented for different iteration states. Also to quantify the comparison between both types of structures we introd uce a self-similarity function which correlates orders or states of the sam e type.