Weighted oscillator strengths and lifetimes for the Si X spectrum

Citation
Gh. Cavalcanti et al., Weighted oscillator strengths and lifetimes for the Si X spectrum, J QUAN SPEC, 64(1), 2000, pp. 5-13
Citations number
23
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER
ISSN journal
00224073 → ACNP
Volume
64
Issue
1
Year of publication
2000
Pages
5 - 13
Database
ISI
SICI code
0022-4073(200001)64:1<5:WOSALF>2.0.ZU;2-J
Abstract
The weighted oscillator strengths (gf) and the lifetimes for Si X presented in this work were carried out in a multiconfiguration Hartree-Fock relativ istic (IIFR) approach. In this calculation, the electrostatic parameters we re optimized by a least-squares procedure, in order to improve the adjustme nt to experimental energy levels. This method produces gf-values that are i n better agreement with intensity observations and lifetime values that are closer to the experimental ones. In this work we presented all the experim entally known electric dipole Si X spectral lines. (C) 1999 Elsevier Scienc e Ltd. All rights reserved.