Hj. Kleebe et G. Pezzotti, Transmission electron microscopy in conjunction with internal friction measurements - A powerful tool for characterization of ceramic interfaces, J CERAM S J, 107(9), 1999, pp. 801-813
Three different non-oxide ceramics, Si3N4, SiAlON, and SiC mere characteriz
ed with respect to their high-temperature micromechanical deformation behav
ior employing both transmission electron microscopy and the internal fricti
on technique. The latter method was utilized to gain a direct measure of th
e high-temperature response of the respective material, i.e., the effect of
the interfacial glass phase commonly observed in liquid-phase sintered cer
amics on externally applied shear stress. Transmission electron microscopy
provides complementary information about the structure and chemistry of int
ernal grain boundaries, which are known to dominate the high-temperature me
chanical behavior of the bulk ceramic polycrystal. In addition, the presenc
e and distribution of amorphous or crystalline secondary phases were charac
terized by electron microscopy. It is shown that, apart from the overall mi
crostructure, the interface structure and/or the local chemical composition
is the main parameter affecting the internal friction behavior. As a conse
quence, this technique allows one to determine the effective interface visc
osity of ceramic polycrystals and to reveal as to whether a bimodal grain-b
oundary structure has developed, e.g., if both wetted and non-wetted interf
aces are present, as is shown for the SiC ceramic.