We present an analytical model describing the instability of the interface
during anodization of p-type resistive silicon in HF electrolyte, leading t
o porous silicon formation. Our analytical approximations are applicable to
p-type amorphous and crystalline silicon with resistivities in the range f
rom about 0.1 to 10,000 Omega cm. For all kinds of p-type silicon, nanopore
formation is predicted to occur first, as it is governed by properties of
the silicon/electrolyte barrier. Then, pores of increasing diameter are exp
ected to grow, up to sizes of the order of a characteristic cutoff length.
Structures above that size occur only when the resistivity of silicon is la
rger than that of the electrolyte. (C) 1999 The electrochemical Society. S0
013-4651(99)01 -085-X. All rights reserved.