Reactive ion etching for mesa structuring in HgCdTe

Both wet chemical and dry plasma etching techniques have been investigated for mesa structuring in n- and p-type HgCdTe. Scanning electron microscopy (SEM) confirms the isotropic nature of a bromine-based wet chemical etching solution, and the anisotropic profile that results from reactive ion etchi ng. Laser-beam-induced-current (LBIC) measurements reveal no significant mo difications to the electrical properties for chemically etched HgCdTe mater ial, but clearly demonstrate a p- to n-type conversion in p-type samples an d n(+) doping in n-type samples for reactive ion etching (RIE) (processing conditions: 400 mTorr, CH4/5H(2), 0.4 W/cm(2)). LBIC measurements following low-temperature (200 degrees C) mercury annealing of RIE-processed samples indicate the full restoration of electrical properties to that of the init ial as-grown wafers, thus preserving the beneficial aspects of RIE for anis otropic mesa structuring in HgCdTe. (C) 1999 American Vacuum Society. [S073 4-2101(98)05805-4].