Epitaxial Bi/Sb superlattices have been grown by molecular beam epitaxy on
CdTe(111)B substrates. The superlattice modulation wavelength was in the ra
nge of 20-200 Angstrom. Structural properties have been investigated using
in situ reflection high-energy electron diffraction (RHEED), theta - 2 thet
a x-ray diffraction (XRD) analysis, and high-resolution transmission electr
on microscopy (TEM). The streaked RHEED patterns of Bi on Sb (or Sb on Bi)
with clear Kikuchi lines indicate layer-by-layer growth with good epitaxial
layer quality. The narrow XRD rocking curves for the central and the satel
lite peaks suggest that the interfaces are very sharp and that the superlat
tice periods do not fluctuate, which is demonstrated in this article by cro
ss-sectional TEM. (C) 1999 American Vacuum Society. [S0734-2101(99)01905-3]
.