Sol-gel synthesis and characterization of Zn2SiO4 : Mn phosphor films

Mn2+-doped Zn2SiO4 phosphor films were deposited on silicon and quartz glas s substrates by sol-gel method (dip-coating). The variations of sol viscosi ty with time, him thickness with the number of layers were investigated in the Zn2SiO4:Mn system. The results of XRD and IR showed that the Zn2SiO4:Mn films remained amorphous below 700 degrees C and crystallized completely a round 1000 degrees C. From AFM studies, it was observed that the grains of 0.5-0.8 mu m in size packed closely in Zn2SiO4:Mn films, which were uniform and crack free. The luminescence properties of Zn2SiO4:Mn films were chara cterized by absorption, excitation and emission spectra, as well as lumines cence decay. (C) 1999 Published by Elsevier Science S.A. All rights reserve d.