Carbon nanotubes are manipulated in three dimensions inside a scanning elec
tron microscope (SEM). A custom piezoelectric vacuum manipulator achieves p
ositional resolutions comparable to scanning probe microscopes, with the ab
ility to manipulate objects along one rotational and three linear degrees o
f freedom. This prototypical device can probe, select and handle nanometre-
scale objects such as carbon nanotubes in order to explore and correlate th
eir mechanical and electrical properties. Under real-time SEM inspection, c
arbon nanotubes are stressed while: monitoring their conductivity, and nano
tubes are attached to commercial atomic force microscope (AFM) tips such th
at the forces applied to the tubes can be measured from the cantilevers' de
flections. The manipulator functions both as a research tool for investigat
ing properties of carbon nanotubes and other nanoscale objects without surf
ace restrictions, and as a rudimentary building device for larger nanotube
assemblies. This capability to select and manipulate nanoscale components a
nd to examine directly their suitability as construction materials during v
arious phases of the construction process will play an important role in en
abling the technology of assembling mechanical and electronic devices from
prefabricated components.