Charge transfer dynamics of low energy oxygen ion beams scattered from Cu(001)

Citation
Ac. Lavery et al., Charge transfer dynamics of low energy oxygen ion beams scattered from Cu(001), NUCL INST B, 157(1-4), 1999, pp. 42-47
Citations number
17
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
157
Issue
1-4
Year of publication
1999
Pages
42 - 47
Database
ISI
SICI code
0168-583X(199908)157:1-4<42:CTDOLE>2.0.ZU;2-F
Abstract
We have studied the scattering of low energy O- and O+ ions off a clean Cu( 001) surface in order to gain further insight into nonadiabatic electron tr ansfer processes during reactive ion-surface collisions. For incident energ ies of 0.45 keV, we have measured O+/O- ratios and the absolute yields of p ositive, negative, and neutral oxygen atoms in the scattered flux over a wi de range of scattering geometries. We have determined the extent to which m emory loss occurs by comparing O+/O- ratios for single scattering events, o btained with incident O- ions and identified with a classical trajectory si mulation, to those made in a similar study [C.A. Keller, A.C. Lavery, B.H. Cooper, Phys. Rev. B. 58 (1998) 10959] that was performed using incident O ions; The neutral and negative ions observed in the scattered flux can be explained with a simple model based on the energetics of resonant charge ex change. The presence of scattered positive ions, however, is explained by i nvoking a collisional mechanism for their production. (C) 1999 Elsevier Sci ence B.V. All rights reserved.