Energy- and angle-dependent trends in the trapping probability of O+ incident on Cu(001)

We have measured the trends in the trapping probability of 5-600 eV O+ ions incident on Cu(0 0 1) at 45 degrees and along the sample normal. The trapp ing probabilities, measured using Auger Electron Spectroscopy (AES), depend strongly on the incident ion energy, but not on the incident angle. Signif icant differences are observed between these trends and those previously me asured for Na+ incident on Cu(0 0 1) over a similar range of energies and a ngles, particularly for the 45 degrees angle of incidence. We conclude that these observations reflect differences in the ion-surface scattering poten tials. (C) 1999 Elsevier Science B.V. All rights reserved.