We present an inverse method for electron transport which allows one to min
imize the value of shut noise for a given value of the conductance by optim
izing the spatial structure of a disordered semiconductor region. The metho
d is based on the Green's function approach which is usually applied to the
direct transport problem. A specific experimentally realizable example of
a two-dimensional disordered semiconductor is presented which demonstrates
the method of minimization of shot noise for insulator, metallic, and trans
itional conductance regions. (C) 1999 Elsevier Science B.V. All rights rese
rved.