The latest results obtained in the development of high-power devices based
on wide-gap semiconductors are examined. It is shown that at present silico
n carbide remains the most promising material for high-temperature, radiati
on-resistant, high-power electronics. Certain factors involving a wide comm
ercial adoption of SiC-based devices are examined. (C) 1999 American Instit
ute of Physics. [S1063- 7826(99)01809-8].